XRF Cement Analyzer
The XRF analysis of cement solves the problem of element analysis quickly, without destruction, and with high accuracy. The XRF can drastically improve the cement production process in each stage: at the quarry to evaluate the raw materials, to assess intermediate products, and to check resulting products to the required standards. Thus XRF can provide high productivity of cement production.
A sample of cement is irradiated with x-ray light that excites atoms in this sample. The atoms emit electromagnetic waves of vision range when they return to their own basic state. The emission of light when the elements return to an excited state is distinctive to the particular elements present and the fluorescence detection makes it possible to calculate the chemical composition of the sample precisely.
The XRF analysis of cement is fast, convenient, simple, and nondestructive.
X-ray fluorescence (XRF) analysis is the universal method for elemental analysis. It combines simple enough procedures and correspondingly cheap equipment. Also, it provides fast and accurate results. Thus, x-ray fluorescence (XRF analysis) in cement analysis is the most convenient, easier, and suitable elemental analysis method in thecement industry.
In cement plants, XRF for cement analysis is used routinely and it is the primary way to control the composition of the raw material, the raw feed, as well as clinker and actually cement. This method provides rapid compositional data for controlling almost all stages of production and is also used for assessing and quality control of the final product.
1、 Instrument usage
The analysis of SiO2, Al2O3, Fe2O3, CaO, MgO, SO3, K2O, Na2O, TiO2, P2O5,
Cl and other contents in raw materials, raw materials, kiln feed, clinker and cement
meets the standard requirements of repeatability and reproducibility limits in GB/T176-
2017 Methods for Chemical Analysis of Cement.
2、 Instrument hardware parameters
1. Adopting secondary target technology
(1) The first target material is an X-ray tube;
(2) Target material: Ag target;
(3) Power: Maximum high voltage 50KV, maximum current 1mA;
(4) Focal spot size: less than 150um;
(5) Cooling method: forced air cooling;
(6) The second target material is a fully focused hyperbolic curved crystal, with
germanium crystal as the secondary target, which can effectively excite K-line
systems of elements such as K, Ca, Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, as well as
some heavy metal L-line systems.
2. Monochromatic focusing excitation light path
(1) High throughput fully focused hyperbolic curved crystal (HF DCC) (the whole
machine has obtained national invention patent technology);
(2) Diffraction efficiency: ≥ 10%;
(3) Focusing spot:~500um;
(4) Monochrome efficiency: over 90%
positional deviation, ensuring the stability of the entire machine;
(6) No drift correction is required.
3. SDD silicon offset detector
(1) Resolution: superior to130eV@Fe：Kα6.4KeV；
(2) Window acceptance area: 30mm ²;
(3) Count rate range: 1000cps-100000 cps;
(4) 48 hour peak drift:<1eV @ Fe: K α 6.4KeV.
4. Using hydrogen gas to blow the optical path
No need for cylinder gas and vacuum protection, using hydrogen atmosphere
protection can reduce system maintenance frequency and cost, and stable analysis
data can be obtained in just a few seconds of inflation.
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X-ray Fluorescence Multi Element Analyzer For Cement
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